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Volumn 492, Issue , 2008, Pages 200/[564]-209/[573]

High resolution ADF-STEM imaging application for organic crystals

Author keywords

ADF STEM; Electron microscopy; High resolution; Organic materials

Indexed keywords

ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

EID: 54549105435     PISSN: 15421406     EISSN: 15635287     Source Type: Journal    
DOI: 10.1080/15421400802330663     Document Type: Article
Times cited : (1)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.