When scanning tunneling microscopy gets the wrong adsorption site: H on Rh(100)

Physical Review Letters

Volumn 90, Issue 17, 2003, Pages

  Klein, C ^a   Eichler, A ^b   Hebenstreit, E L D ^a   Pauer, G ^c   Koller, R ^a   Winkler, A ^c   Schmid, M ^a   Varga, P ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

^c GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMS; HYDROGEN; LOW ENERGY ELECTRON DIFFRACTION; PROBABILITY DENSITY FUNCTION; RHODIUM; SURFACE TREATMENT; TEMPERATURE PROGRAMMED DESORPTION;

ADDITIONAL ANALYSIS TECHNIQUES; BRIDGE SITE; LOW TUNNELING RESISTANCE;

SCANNING TUNNELING MICROSCOPY;

EID: 5444258252     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (27)

1. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
2. P. Sautet, Surf. Sci. 374, 406 (1997).
3. W. A. Hofer, A. J. Fisher, R. A. Wolkow, and P. Grütter, Phys. Rev. Lett. 87, 236104 (2001).
4. M. Schmid and P. Varga, in Alloy Surfaces and Surface Alloys, edited by D. Woodruff (Elsevier, Amsterdam, 2002), p. 118.
5. Y.W. Mo, Phys. Rev. Lett. 71, 2923 (1993)
6. J. Li, R. Berndt, and W.-D. Schneider, Phys. Rev. Lett. 76, 1888 (1996).
7. A. Eichler, J. Hafner, and G. Kresse, J. Phys. Condens. Matter 8, 7659 (1996).
8. G. Teeter, D. Hinson, J. L. Erskine, C. B. Duke, and A. Paton, Phys. Rev. B 57, 4073 (1998).
9. L. J. Richter, T. A. Germer, J. P. Sethna, and W. Ho, Phys. Rev. B 38, 10 403 (1988).
10. L.P. Nielsen, F. Besenbacher, E. Lægsgaard, and I. Stensgaard, Phys. Rev. B 44, 13 156 (1991).
11. A. Grigo, D. Badt, H. Wengelnik, and H. Neddermeyer, Surf. Sci. 331, 1077 (1995).
12. L. J. Lauhon and W. Ho, Phys. Rev. Lett. 85, 4566 (2000).
13. V. Blum and K. Heinz, Comput. Phys. Commun. 134, 392 (2001).
14. J. Rundgren (private communication).
15. S. Crampin and P. Rous, Surf. Sci. 244, L137 (1991).
16. J. Pendry, J. Phys. C 13, 937 (1980).
17. A. Winkler, J. Vac. Sci. Technol. 5, 2430 (1987).
18. G. Kresse and J. Furthmüller, Comput. Mater. Sci. 6, 15 (1996)
19. G. Kresse and J. Furthmüller, Phys. Rev. B 54, 11 169 (1996).
20. P. E. Blöchl, Phys. Rev. B 50, 17 953 (1994).
21. G. Kresse and D. Joubert, Phys. Rev. B 59, 1758 (1999).
22. J. P. Perdew et al., Phys. Rev. B 46, 6671 (1992).
23. Pe, which was shown to be a too pessimistic estimation; see M. Sporn et al., Surf. Sci. 416, 423 (1998).
24. G. Pauer, A. Eichler, and A. Winkler (to be published).
25. We further on refrain from using the term adsorption energy in favor of potential energy due to the disturbance of the system by the STM tip.
26. A. J. Heinrich, C. P. Lutz, and D. M. Eigler, Science 298, 1381 (2002).
27. Recently, determination of positions of the slightly stronger scatterer deuterium has been achieved in a LEED study; see G. Held et al., Phys. Rev. Lett. 87, 216102 (2001).