A new reseeding technique for LFSR-based test pattern generation

Proceedings - 7th International On-Line Testing Workshop, IOLTW 2001

Volumn 2001-January, Issue , 2001, Pages 80-86

  Kalligeros, E ^a   Kavousianos, X ^a   Bakalis, D ^a   Nikolos, D ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; HARDWARE;

BENCHMARK CIRCUIT; CARDINALITIES; FAULT COVERAGES; LOGIC VALUES; RANDOM-PATTERN-RESISTANT; TEST PATTERN GENERATIONS; TEST PATTERN GENERATOR; TEST SEQUENCE;

TESTING;

EID: 5444246652     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2001.937823     Document Type: Conference Paper

References (13)

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