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Volumn 56, Issue 19, 2008, Pages 5617-5626

Focused ion beam micro-dissection of cold-sprayed particles

Author keywords

Bonding; Coating; Plastic deformation

Indexed keywords

ABS RESINS; ALUMINUM; BEAM PLASMA INTERACTIONS; CERAMIC MATERIALS; COPPER; DEBRIS; DEFORMATION; ELECTROMAGNETIC WAVES; ION BEAMS; ION BOMBARDMENT; LIGHT METALS; MELTING POINT; PESTICIDES; PIEZOELECTRIC CERAMICS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; PLASTIC DEFORMATION; SMELTING; SUBSTRATES; THERMOCHEMISTRY;

EID: 54249165376     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.07.034     Document Type: Article
Times cited : (113)

References (45)
  • 22
    • 54249131835 scopus 로고    scopus 로고
    • Vlcek J, Huber H, Voggenreiter H, Lugscheider E. Presented at Materials Week 2002, international congress on advanced materials, their processes and applications, Deutsche Gesellschaff fur Materialkunde (DGM); 2002.
    • Vlcek J, Huber H, Voggenreiter H, Lugscheider E. Presented at Materials Week 2002, international congress on advanced materials, their processes and applications, Deutsche Gesellschaff fur Materialkunde (DGM); 2002.
  • 24
    • 0033007641 scopus 로고    scopus 로고
    • Phaneuf M.W. Micron 30 3 (1999) 277-288
    • (1999) Micron , vol.30 , Issue.3 , pp. 277-288
    • Phaneuf, M.W.1
  • 37


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.