Coarsening of two-dimensional Al2O3 islands on vicinal (1, -1, 0, 2) sapphire surfaces during annealing in air

Surface Science

Volumn 602, Issue 21, 2008, Pages 3232-3238

  Nguyen, T T T ^a   Bonamy, D ^a   Van, L Pham ^a   Barbier, L ^a   Cousty, J ^a  

^a DIF   (France)

Author keywords

Alumina; Atomic force microscopy (AFM); Single crystal surfaces; Surface diffusion; Surface structure, morphology, roughness and topography

Indexed keywords

ACTIVATION ENERGY; ANNEALING; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CORUNDUM; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ISOTHERMAL ANNEALING; MICROSCOPIC EXAMINATION; OSTWALD RIPENING; SAPPHIRE; SCANNING PROBE MICROSCOPY; SINGLE CRYSTALS; SOIL CONSERVATION; SURFACE DIFFUSION; SURFACE MORPHOLOGY; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; TWO DIMENSIONAL;

2D ISLANDS; AFM IMAGES; ANISOTROPIC OSTWALD RIPENING; ATOMIC FORCE MICROSCOPY (AFM); ATOMIC FORCES; MASS TRANSPORTS; MECHANICAL POLISHING; SAPPHIRE SURFACES; STATISTICAL ANALYSIS;

SINGLE CRYSTAL SURFACES;

EID: 54249100838     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.08.022     Document Type: Article

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