SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 496, Issue 3, 2002, Pages 238-250

Crystal truncation rod diffraction study of the α-Al2O3 (1 1̄ 0 2) surface

(5) Trainor, Thomas P a,b Eng, Peter J b Brown Jr , Gordon E a,c Robinson, Ian K d De Santis, Maurizio e

a STANFORD UNIVERSITY (United States)

b UNIVERSITY OF CHICAGO (United States)

c SLAC NATIONAL ACCELERATOR LABORATORY (United States)

d University of Illinois at Urbana Champaign (United States)

e LABORATOIRE DE CRISTALLOGRAPHIE (France)

Author keywords

Aluminum oxide; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

ALUMINA; ANNEALING; LEAST SQUARES APPROXIMATIONS; MORPHOLOGY; SPUTTERING; X RAY SCATTERING;

CRYSTAL TRUNCATION ROD (CTR) DIFFRACTION;

SURFACE ROUGHNESS;

EID: 0037050208 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01617-X Document Type: Article

Times cited : (111)

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