-
1
-
-
0032606831
-
-
A. Ohtomo, M. Kawasaki, I. Ohkubo, H. Koinuma, T. Yasuda, and Y. Segawa, Appl. Phys. Lett. 75, 980 (1999).
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 980
-
-
Ohtomo, A.1
Kawasaki, M.2
Ohkubo, I.3
Koinuma, H.4
Yasuda, T.5
Segawa, Y.6
-
2
-
-
0035477444
-
-
C. H. Chia, T. Makino, Y. Segawa, M. Kawasaki, A. Ohtomo, K. Tamura, and H. Koinuma, J. Appl. Phys. 90, 3650 (2001).
-
(2001)
J. Appl. Phys.
, vol.90
, pp. 3650
-
-
Chia, C.H.1
Makino, T.2
Segawa, Y.3
Kawasaki, M.4
Ohtomo, A.5
Tamura, K.6
Koinuma, H.7
-
3
-
-
24944453155
-
-
K. Koike, I. Nakashima, K. Hashimoto, S. Sasa, M. Inoue, and M. Yano, Appl. Phys. Lett. 87, 112106 (2005).
-
(2005)
Appl. Phys. Lett.
, vol.87
, pp. 112106
-
-
Koike, K.1
Nakashima, I.2
Hashimoto, K.3
Sasa, S.4
Inoue, M.5
Yano, M.6
-
4
-
-
0037415912
-
-
S. Muthukumar, J. Zhong, Y. Chen, T. Siegrist, and Y. Lu, Appl. Phys. Lett. 82, 742 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 742
-
-
Muthukumar, S.1
Zhong, J.2
Chen, Y.3
Siegrist, T.4
Lu, Y.5
-
5
-
-
31644440591
-
-
J. Z. Ṕrez, V. M. Sanjoś, M. Lorenz, G. Benndorf, S. Heitsch, D. Spemann, and M. Grundmann, J. Appl. Phys. 99, 023514 (2006).
-
(2006)
J. Appl. Phys.
, vol.99
, pp. 023514
-
-
Ṕrez, J.Z.1
Sanjoś, V.M.2
Lorenz, M.3
Benndorf, G.4
Heitsch, S.5
Spemann, D.6
Grundmann, M.7
-
6
-
-
11044221661
-
-
P. Misra, Y. J. Sun, O. Brandt, and H. T. Grahn, J. Appl. Phys. 96, 7029 (2004).
-
(2004)
J. Appl. Phys.
, vol.96
, pp. 7029
-
-
Misra, P.1
Sun, Y.J.2
Brandt, O.3
Grahn, H.T.4
-
7
-
-
0000683348
-
-
C. R. Gorla, W. E. Mayo, S. Liang, and Y. Lu, J. Appl. Phys. 87, 3736 (2000).
-
(2000)
J. Appl. Phys.
, vol.87
, pp. 3736
-
-
Gorla, C.R.1
Mayo, W.E.2
Liang, S.3
Lu, Y.4
-
8
-
-
37149006439
-
-
A. Schleife, C. Rödl, F. Fuchs, J. Furthmüller, and F. Bechstedt, Appl. Phys. Lett. 91, 241915 (2007).
-
(2007)
Appl. Phys. Lett.
, vol.91
, pp. 241915
-
-
Schleife, A.1
Rödl, C.2
Fuchs, F.3
Furthmüller, J.4
Bechstedt, F.5
-
10
-
-
34249079523
-
-
G. Saraf, J. Zhong, O. Dulub, U. Diebold, T. Siegrist, and Y. Lu, J. Electron. Mater. 36, 446 (2007).
-
(2007)
J. Electron. Mater.
, vol.36
, pp. 446
-
-
Saraf, G.1
Zhong, J.2
Dulub, O.3
Diebold, U.4
Siegrist, T.5
Lu, Y.6
-
11
-
-
0347415793
-
-
S. Muthukumar, Y. Chen, J. Zhong, F. Cosandey, Y. Lu, and T. Siegrist, J. Cryst. Growth, 261, 316 (2004).
-
(2004)
J. Cryst. Growth
, vol.261
, pp. 316
-
-
Muthukumar, S.1
Chen, Y.2
Zhong, J.3
Cosandey, F.4
Lu, Y.5
Siegrist, T.6
-
13
-
-
0347415793
-
-
S. Muthukumar, Y. Chen, J. Zhong, F. Cosandey, Y. Lu, and T. Siegrist, J. Cryst. Growth 261, 316 (2004).
-
(2004)
J. Cryst. Growth
, vol.261
, pp. 316
-
-
Muthukumar, S.1
Chen, Y.2
Zhong, J.3
Cosandey, F.4
Lu, Y.5
Siegrist, T.6
-
14
-
-
0000939615
-
-
A. Ohtomo, M. Kawasaki, T. Koida, K. Masubuchi, Y. Sakurai, Y. Yoshida, T. Yasuda, Y. Segawa, and H. Koinuma, Appl. Phys. Lett. 72, 2466 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2466
-
-
Ohtomo, A.1
Kawasaki, M.2
Koida, T.3
Masubuchi, K.4
Sakurai, Y.5
Yoshida, Y.6
Yasuda, T.7
Segawa, Y.8
Koinuma, H.9
-
15
-
-
85013840926
-
-
(Elsevier Science and Technology, Amsterdam, The Netherlands).
-
Chennupati Jagadish and S. J. Pearton, Zinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties and Applications (Elsevier Science and Technology, Amsterdam, The Netherlands, 2006).
-
(2006)
Zinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties and Applications
-
-
Jagadish, C.1
Pearton, S.J.2
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