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Applied Physics Letters

Volumn 93, Issue 4, 2008, Pages

In-plane anisotropic strain in a-ZnO films grown on r -sapphire substrates

(3) Saraf, G a Lu, Y a Siegrist, T b,c

a RUTGERS UNIVERSITY (United States)

b LUCENT TECHNOLOGIES (United States)

c Och Spine at New York Presbyterian Hospitals (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CORUNDUM; CRYSTALLOGRAPHY; CURVE FITTING; LATTICE MISMATCH; MAGNETIC FILMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; NUMERICAL ANALYSIS; SAPPHIRE; SEMICONDUCTING ZINC COMPOUNDS; STRAIN; ZINC ALLOYS; ZINC OXIDE;

A-PLANE; ANISOTROPIC STRAINS; C -AXIS; COMPRESSIVE STRAINS; FILM-THICKNESS; IN-PLANE; IN-PLANE STRAINS; INTERFACIAL STRAIN; LATTICE MISMATCHING; METAL-ORGANIC CHEMICAL VAPOR DEPOSITION; NON-POLAR; OUT-OF PLANE; R-SAPPHIRE; TRIPLE-AXIS X-RAY DIFFRACTION; UNIT CELLS; ZNO FILMS;

TENSILE STRAIN;

EID: 49149085082 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2965801 Document Type: Article

Times cited : (46)

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