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Volumn 93, Issue 15, 2008, Pages

Intrinsic generation of OH groups in dry silicon dioxide upon thermal treatments

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CONCENTRATION (PROCESS); CURING; HEAT TREATMENT; HELIUM; NETWORK PROTOCOLS; SENSOR NETWORKS; THERMAL SPRAYING;

EID: 54149095994     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2998581     Document Type: Article
Times cited : (13)

References (15)
  • 1
    • 0142119939 scopus 로고    scopus 로고
    • edited by H. S. Nalwa (Academic, New York).
    • Silicon-Based Materials and Devices, edited by, H. S. Nalwa, (Academic, New York, 2001).
    • (2001) Silicon-Based Materials and Devices
  • 2
    • 42049119663 scopus 로고    scopus 로고
    • 0163-1829 10.1103/PhysRevB.77.165203.
    • E. Vella, R. Boscaino, and G. Navarra, Phys. Rev. B 0163-1829 10.1103/PhysRevB.77.165203 77, 165203 (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 165203
    • Vella, E.1    Boscaino, R.2    Navarra, G.3
  • 7
    • 9544252201 scopus 로고    scopus 로고
    • 0022-3093 10.1016/j.jnoncrysol.2004.07.013.
    • A. Oehler and M. Tomozawa, J. Non-Cryst. Solids 0022-3093 10.1016/j.jnoncrysol.2004.07.013 347, 211 (2004).
    • (2004) J. Non-Cryst. Solids , vol.347 , pp. 211
    • Oehler, A.1    Tomozawa, M.2
  • 8
    • 0019011016 scopus 로고
    • 0021-8979 10.1063/1.327986.
    • J. E. Shelby, J. Appl. Phys. 0021-8979 10.1063/1.327986 51, 2589 (1980).
    • (1980) J. Appl. Phys. , vol.51 , pp. 2589
    • Shelby, J.E.1
  • 10
    • 54149116463 scopus 로고    scopus 로고
    • in Ref., Vol..
    • M. Tomozawa in Ref., Vol. 1, p. 127.
    • , vol.1 , pp. 127
    • Tomozawa, M.1
  • 14
    • 0030564072 scopus 로고    scopus 로고
    • 0022-3093 10.1016/0022-3093(95)00631-1.
    • K. M. Davis and M. Tomozawa, J. Non-Cryst. Solids 0022-3093 10.1016/0022-3093(95)00631-1 201, 177 (1996).
    • (1996) J. Non-Cryst. Solids , vol.201 , pp. 177
    • Davis, K.M.1    Tomozawa, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.