Erratum: Micron-scale measurements of the coefficient of thermal expansion by time-domain probe beam deflection (Journal of Applied Physics (2008) 104 (073509) DOI: 10.1063/1.2988111);Micron-scale measurements of the coefficient of thermal expansion by time-domain probe beam deflection

Journal of Applied Physics

Volumn 104, Issue 7, 2008, Pages

  Zheng, Xuan ^a   Cahill, David G ^a   Weaver, Richard ^a   Zhao, Ji Cheng ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; EXPANSION; FIBER OPTIC SENSORS; IRON ALLOYS; PROBES; TIME DOMAIN ANALYSIS; TOOTH ENAMEL;

BEAM DEFLECTION; DENTIN-ENAMEL JUNCTIONS; LATERAL TEMPERATURE GRADIENTS; MEASUREMENTS OF; OPTICAL TECHNIQUE; PROBE BEAM DEFLECTION; QUANTITATIVE MODELING; SPATIAL RESOLUTION;

THERMAL EXPANSION;

EID: 54049145902     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.5010943     Document Type: Erratum

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