Stress and microstructure evolution during initial growth of Pt on amorphous substrates

Journal of Materials Research

Volumn 15, Issue 11, 2000, Pages 2540-2546

  Phillips, M A ^a   Ramaswamy, V ^a   Clemens, B M ^a   Nix, W D ^a  

^a Stanford University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COALESCENCE; FILM GROWTH; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MICROSTRUCTURE; STRESS ANALYSIS; SUBSTRATES; TENSILE STRESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS SUBSTRATES;

PLATINUM;

EID: 0034333888     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2000.0364     Document Type: Article

References (9)