Optical properties of GaN by using ellipsometry and a band calculation

Journal of the Korean Physical Society

Volumn 53, Issue 3, 2008, Pages 1575-1579

  Kim, Tae Jung ^a   Byun, Jun Seok ^a   Kim, Young Dong ^a   Chang, Yia Chung ^b   Kim, Hye Jung ^b,c  

^a Kyung Hee University   (South Korea)

^b RESEARCH CENTER FOR APPLIED SCIENCES   (Taiwan)

^c United States of America   (United States)

Author keywords

Band structure; Dielectric function; Ellipsometry; GaN

Indexed keywords

EID: 53549086921     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.53.1575     Document Type: Conference Paper

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