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Volumn 277, Issue 1-3, 2008, Pages 314-320

Probing low-energy electron induced DNA damage using single photon ionization mass spectrometry

Author keywords

Dissociative electron attachment; Dissociative ionization; DNA strand breaks; Low energy electron; Single photon ionization

Indexed keywords


EID: 53449088125     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2008.07.003     Document Type: Article
Times cited : (30)

References (34)
  • 6
    • 53449102390 scopus 로고    scopus 로고
    • A.F. Fuciarelli, J.D. Zimbrick, Editors, Fourth in a Series of International Workshops held at the Salishan Lodge in Gleneden Beach, Oregon, October 1-6, 1994, 1995.
    • A.F. Fuciarelli, J.D. Zimbrick, Editors, Fourth in a Series of International Workshops held at the Salishan Lodge in Gleneden Beach, Oregon, October 1-6, 1994, 1995.
  • 10
    • 53449100726 scopus 로고    scopus 로고
    • International commission on radiation units and measurements, IRCU Report 31, 1979.
    • International commission on radiation units and measurements, IRCU Report 31, 1979.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.