-
1
-
-
0018547168
-
Modeling diffusion and collection of charge from ionizing radiation in silicon devices
-
Nov
-
S. Kirkpatrick, "Modeling diffusion and collection of charge from ionizing radiation in silicon devices," IEEE Trans. Electron Dev., vol. ED-26, no. 11, pp. 1742-1753, Nov. 1979.
-
(1979)
IEEE Trans. Electron Dev
, vol.ED-26
, Issue.11
, pp. 1742-1753
-
-
Kirkpatrick, S.1
-
2
-
-
0023399455
-
Analytic modeling of charge diffusion in charge-coupled-device imagers
-
Aug
-
G. R. Hopkinson, "Analytic modeling of charge diffusion in charge-coupled-device imagers," Opt. Eng., vol. 26, no. 8, pp. 766-772, Aug. 1987.
-
(1987)
Opt. Eng
, vol.26
, Issue.8
, pp. 766-772
-
-
Hopkinson, G.R.1
-
3
-
-
0025683826
-
Imaging charge-coupled device (CCD) transient response to 17 and 50 MeV proton and heavy-ion irradiation
-
Dec
-
T. S. Lomheim, R. M. Shima, J. R. Angione, W. F. Wooddward, D. J. Asman, R. A. Keller, and L. W. Shumann, "Imaging charge-coupled device (CCD) transient response to 17 and 50 MeV proton and heavy-ion irradiation," IEEE Trans. Nucl. Sci., vol. 37, no. 6, pp. 1876-1885, Dec. 1990.
-
(1990)
IEEE Trans. Nucl. Sci
, vol.37
, Issue.6
, pp. 1876-1885
-
-
Lomheim, T.S.1
Shima, R.M.2
Angione, J.R.3
Wooddward, W.F.4
Asman, D.J.5
Keller, R.A.6
Shumann, L.W.7
-
4
-
-
0026139259
-
Charge collected by diffusion from an ion track under mixed boundary conditions
-
Apr
-
L. D. Edmonds, "Charge collected by diffusion from an ion track under mixed boundary conditions," IEEE Tran. Nucl. Sci., vol. 38, no. 2, pp. 834-837, Apr. 1991.
-
(1991)
IEEE Tran. Nucl. Sci
, vol.38
, Issue.2
, pp. 834-837
-
-
Edmonds, L.D.1
-
5
-
-
0029535998
-
Application of a diffusion model to SEE cross sections of modern devices
-
Dec
-
E. C. Smith, E. G. Stassinopoulos, K. Label, G. Brucker, and C. M. Seidlick, "Application of a diffusion model to SEE cross sections of modern devices," IEEE Trans. Nucl. Sci., vol. 42, no. 6, pp. 1772-1779, Dec. 1995.
-
(1995)
IEEE Trans. Nucl. Sci
, vol.42
, Issue.6
, pp. 1772-1779
-
-
Smith, E.C.1
Stassinopoulos, E.G.2
Label, K.3
Brucker, G.4
Seidlick, C.M.5
-
6
-
-
0030216220
-
A graphical method for estimating charge collected by diffusion from an ion track
-
Aug
-
L. D. Edmonds, "A graphical method for estimating charge collected by diffusion from an ion track," IEEE Trans. Nucl. Sci., vol. 43, no. 4, pp. 2346-2357, Aug. 1996.
-
(1996)
IEEE Trans. Nucl. Sci
, vol.43
, Issue.4
, pp. 2346-2357
-
-
Edmonds, L.D.1
-
7
-
-
0032002773
-
The influence of spatial variations of diffusion length on charge collected by diffusion from ion tracks
-
Feb
-
L. D. Edmonds, "The influence of spatial variations of diffusion length on charge collected by diffusion from ion tracks," IEEE Trans. Nucl. Sci., vol. 45, no. 1, pp. 30-40, Feb. 1998.
-
(1998)
IEEE Trans. Nucl. Sci
, vol.45
, Issue.1
, pp. 30-40
-
-
Edmonds, L.D.1
-
8
-
-
85008065972
-
A time-dependent charge-collection efficiency for diffusion
-
Oct
-
L. D. Edmonds, "A time-dependent charge-collection efficiency for diffusion," IEEE Trans. Nucl. Sci., vol. 48, no. 5, pp. 1609-1622, Oct. 2001.
-
(2001)
IEEE Trans. Nucl. Sci
, vol.48
, Issue.5
, pp. 1609-1622
-
-
Edmonds, L.D.1
-
9
-
-
0036947787
-
Monte Carlo exploration of neutron-induced SEU-sensitive volumes in SRAMs
-
Dec
-
J.-M. Palau, F. Wrobel, K. Castellani-Coulié, M.-C. Calvet, P. E. Dodd, and F. W. Sexton, "Monte Carlo exploration of neutron-induced SEU-sensitive volumes in SRAMs," IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 3075-3081, Dec. 2002.
-
(2002)
IEEE Trans. Nucl. Sci
, vol.49
, Issue.6
, pp. 3075-3081
-
-
Palau, J.-M.1
Wrobel, F.2
Castellani-Coulié, K.3
Calvet, M.-C.4
Dodd, P.E.5
Sexton, F.W.6
-
10
-
-
0036956109
-
Radiation-Induced charge collection in infrared detector arrays
-
Dec
-
J. C. Pickel, R. A. Reed, R. Ladbury, B. Rauscher, P. W. Marshall, T. M. Jordan, B. Fodness, and G. Gee, "Radiation-Induced charge collection in infrared detector arrays," IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 2822-2829, Dec. 2002.
-
(2002)
IEEE Trans. Nucl. Sci
, vol.49
, Issue.6
, pp. 2822-2829
-
-
Pickel, J.C.1
Reed, R.A.2
Ladbury, R.3
Rauscher, B.4
Marshall, P.W.5
Jordan, T.M.6
Fodness, B.7
Gee, G.8
-
11
-
-
0036957354
-
Modeling the contribution of diffusion to device-upset cross sections
-
Dec
-
J. D. Patterson and L. D. Edmons, "Modeling the contribution of diffusion to device-upset cross sections," IEEE Trans. Nucl. Sci., vol. 49, no. 6, pp. 3067-3074, Dec. 2002.
-
(2002)
IEEE Trans. Nucl. Sci
, vol.49
, Issue.6
, pp. 3067-3074
-
-
Patterson, J.D.1
Edmons, L.D.2
-
12
-
-
27644435667
-
Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER
-
Aug
-
T. Mérelle, H. Chabane, J.-M. Palau, K. Castellani-Coulié, F. Wrobel, F. Saigné, B. Sagnes, J. Boch, J. R. Vaille, G. Gasiot, P. Roche, M.-C. Palau, and T. Carrière, "Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER," IEEE Trans. Nucl. Sci., vol. 52, no. 4, pp. 1148-1155, Aug. 2005.
-
(2005)
IEEE Trans. Nucl. Sci
, vol.52
, Issue.4
, pp. 1148-1155
-
-
Mérelle, T.1
Chabane, H.2
Palau, J.-M.3
Castellani-Coulié, K.4
Wrobel, F.5
Saigné, F.6
Sagnes, B.7
Boch, J.8
Vaille, J.R.9
Gasiot, G.10
Roche, P.11
Palau, M.-C.12
Carrière, T.13
-
13
-
-
29144488380
-
Monte Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs
-
Oct
-
T. Mérelle, F. Saigné, B. Sagnes, G. Gasiot, P. Roche, T. Carrière, M.-C. Palau, F. Wrobel, and J.-M. Palau, "Monte Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs," IEEE Trans. Nucl. Sci., vol. 52, no. 5, pp. 1538-1544, Oct. 2005.
-
(2005)
IEEE Trans. Nucl. Sci
, vol.52
, Issue.5
, pp. 1538-1544
-
-
Mérelle, T.1
Saigné, F.2
Sagnes, B.3
Gasiot, G.4
Roche, P.5
Carrière, T.6
Palau, M.-C.7
Wrobel, F.8
Palau, J.-M.9
-
14
-
-
53349113376
-
-
J. P. David, Simulation 3D Des Phénomènes de Collection de Charges. Extraction de Lois de Comportement Analytiques. Report No RTS 1/10907 DESP, 2006, CNES contract No 4500015344/DCT094.
-
J. P. David, "Simulation 3D Des Phénomènes de Collection de Charges. Extraction de Lois de Comportement Analytiques. Report No RTS 1/10907 DESP," 2006, CNES contract No 4500015344/DCT094.
-
-
-
|