SCOPUS 정보 검색 플랫폼

Volumn 93, Issue 13, 2008, Pages

Degradation studies on high-voltage-driven organic light-emitting device using in situ on-operation method with scanning photoelectron microscopy

(4) Lee, J a Sohn, S a Yun, H J b Shin, H J c

a Korea Basic Science Institute (KBSI) (South Korea)

b Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

c POSTECH (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVES; HELMET MOUNTED DISPLAYS; LIGHT EMISSION; ORGANIC LIGHT EMITTING DIODES (OLED); PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; QUANTUM EFFICIENCY; SCANNING; TIN; TITANIUM COMPOUNDS;

DEGRADATION BEHAVIOR; DEGRADATION PROCESSING; HIGH VOLTAGES; IN-SITU; INDIUM TIN OXIDES; ORGANIC LIGHT-EMITTING DEVICE; SCANNING PHOTOELECTRON MICROSCOPY; VACUUM ENVIRONMENT;

DEGRADATION;

EID: 53349090010 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2994668 Document Type: Article

Times cited : (7)

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- The sample current was obtained by measuring the current flow (to compensate the photoelectrons) from the ground to the sample. The sample current image represents the distribution of changes in absorbance and the electron yield of the photoelectrons.
- The sample current was obtained by measuring the current flow (to compensate the photoelectrons) from the ground to the sample. The sample current image represents the distribution of changes in absorbance and the electron yield of the photoelectrons.

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