Electrostatic micromanipulation of a conductive/dielectric particle by a single probe

2007 7th IEEE International Conference on Nanotechnology - IEEE-NANO 2007, Proceedings

Volumn , Issue , 2007, Pages 733-736

  Saito, Shigeki ^a   Sonoda, Masaki ^a   Ochiai, Toshihiro ^a   Han, Min ^a   Takahashi, Kunio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Adhesion; Condutive; Dielectric; Electrostatic; Micromanipulation; Particle

Indexed keywords

DIELECTRIC PROPERTIES; ELECTROSTATICS; MICROMANIPULATORS; MICROMETERS; NANOTECHNOLOGY; NUMERICAL ANALYSIS; PHENOLS; SUBSTRATES; TECHNOLOGY; THICKNESS MEASUREMENT;

ADHESION; BOUNDARY ELEMENTS; CONDUCTIVE PARTICLES; CONDUCTIVE PLATES; CONDUCTIVE PROBE; CONDUTIVE; CONSTANT VOLTAGE; DIELECTRIC; DIELECTRIC PARTICLES; ELECTROSTATIC; FUNCTION OF TIME; INTERNATIONAL CONFERENCES; MANIPULATION SYSTEM; MICRO MANIPULATIONS; MICROMANIPULATION; PARTICLE; POLYSTYRENE PARTICLES;

BOUNDARY ELEMENT METHOD;

EID: 52949116846     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2007.4601292     Document Type: Conference Paper

References (7)

1. D. A. Hays, Inst. Phys. Conf. Ser., Vol. 118, p. 223, 1991.
2. J. Q. Feng, E. A. Ekulund, and D. A. Hays, J. Electrost., Vol. 40-41, p. 289, 1997.
3. H. Mizes, M. Ott, E. A. Eklund, and D. A. Hays, Colloids Surf, Vol. A 165, p. 11, 2000.
4. M. Egashira, T. Konno, and N. Shinya, J. Intell. Mater. Syst. Struct., Vol. 7, p. 267, 1996.
5. K. Takahashi, H. Kajihara, M. Uragou, S. Saito, Y. Mochimaru, and T. Onzawa, Journal of Applied. Physics, Vol.90, No.1, pp.432-437, 2001.
6. S. Saito, H. Himeno, and K. Takahashi, Journal of Applied Physics, Vol. 93, No. 4, pp.2219-2224, 2003.
7. S. Saito, H. Himeno, K. Takahashi, and M. Urago, Applied Physics Letters, Vol.83, No. 10, pp. 2076-2078, 2003.