Electrostatic detachment of an adhering particle from a micromanipulated probe

Journal of Applied Physics

Volumn 93, Issue 4, 2003, Pages 2219-2224

  Saito, Shigeki ^a   Himeno, Hideo ^a   Takahashi, Kunio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; ELECTRIC POTENTIAL; GRAVITATIONAL EFFECTS; MATHEMATICAL MODELS;

SPHERICAL MICROPARTICLES;

ELECTROSTATICS;

EID: 0037442469     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1537452     Document Type: Article

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