Characterization of cellulose nanocrystal surfaces by SPM

Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008

Volumn 2, Issue , 2008, Pages 704-707

  Lahiji, R R ^a   Reifenberger, R ^a   Raman, A ^a,b   Rudie, Alan ^c   Moon, R J ^a,b,c  

^a PURDUE UNIVERSITY   (United States)

^b Purdue University

^c US Forest Service

Author keywords

Atomic force microscopy; Cellulose nanocrystals; Pull off force; Relative humidity; Stiffness; Topography

Indexed keywords

CELLULOSE NANOCRYSTALS; CONTACT GEOMETRY; DATA ANALYSIS; LIFE SCIENCES; PULL-OFF FORCE; PULL-OFF FORCES; RELATIVE HUMIDITY; TOPOGRAPHY; TRADE SHOWS;

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; CAPILLARITY; CELLULOSE; CELLULOSE DERIVATIVES; CHEMISTRY; COMMERCE; EXHIBITIONS; HEALTH; IMAGING TECHNIQUES; MECHANICAL PROPERTIES; MICROSCOPIC EXAMINATION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURES; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; SECURITY OF DATA; SELF PHASE MODULATION; SILICONES; SINGLE POINT MOORING; SPACE PROBES; STATISTICAL METHODS; STATISTICAL PROCESS CONTROL; STIFFNESS; SURFACE CHEMISTRY; TECHNOLOGY;

SURFACES;

CELLULOSE; CHEMISTRY; DATA PROCESSING; HUMIDITY; MECHANICAL PROPERTIES; MICROSCOPY; STIFFNESS; SURFACE PROPERTIES; SURFACES; TOPOGRAPHY;

EID: 52649182111     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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