Continuous electrical in situ contact area measurement during instrumented indentation

Journal of Materials Research

Volumn 23, Issue 9, 2008, Pages 2480-2485

  Fang, Lei ^a   Muhlstein, Christopher L ^b   Collins, James G ^b   Romasco, Amber L ^b   Friedman, Lawrence H ^a  

^a The Pennsylvania State University   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS; MATERIALS PROPERTIES; STATISTICAL METHODS; THICK FILMS;

CONTACT AREAS; CONTINUOUS FUNCTIONS; DATA ANALYSIS; DYNAMIC PROPERTIES; ELECTRICAL CONTACTS; IN-SITU; INDENTER; INSTRUMENTED INDENTATION; MECHANICAL CHARACTERIZATIONS; THIN FILMS;

VICKERS HARDNESS TESTING;

EID: 52649098535     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2008.0298     Document Type: Article

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