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Volumn , Issue , 2008, Pages

Design advisor for package-on-package (PoP) manufacturing

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; INDUSTRIAL APPLICATIONS; INDUSTRIAL ENGINEERING; MACHINE DESIGN; NUMERICAL METHODS; PACKAGING MATERIALS; POLLUTION; PRODUCTION ENGINEERING; TECHNOLOGY; THREE DIMENSIONAL;

EID: 52449120954     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2008.4606950     Document Type: Conference Paper
Times cited : (8)

References (13)
  • 1
    • 33847078941 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors ITRS, 2007 Edition
    • International Technology Roadmap for Semiconductors (ITRS) - Assembly and Packaging, 2007 Edition.
    • Assembly and Packaging
  • 2
    • 52449123592 scopus 로고    scopus 로고
    • Advanced IC Packaging, Electronic Trend Publications, Inc., 2007.
    • Advanced IC Packaging, Electronic Trend Publications, Inc., 2007.
  • 9
    • 50149110978 scopus 로고    scopus 로고
    • Warpage and Stress Characteristic Analyses on Package-on-Package (PoP) Structure
    • Y. L. Tzeng, N. Kao, E. Chen, et al., "Warpage and Stress Characteristic Analyses on Package-on-Package (PoP) Structure", Electronics Packaging Technology Conference, 2007, pp. 482-487.
    • (2007) Electronics Packaging Technology Conference , pp. 482-487
    • Tzeng, Y.L.1    Kao, N.2    Chen, E.3
  • 10
    • 50049135371 scopus 로고    scopus 로고
    • Design for Improvement of Drop Impact Performance of Package-on-Package
    • J. E. Luan, "Design for Improvement of Drop Impact Performance of Package-on-Package", Electronics Packaging Technology Conference, 2007, pp. 937-942.
    • (2007) Electronics Packaging Technology Conference , pp. 937-942
    • Luan, J.E.1
  • 13
    • 52449123862 scopus 로고    scopus 로고
    • JESD22B112, High Temperature Package Warpage Measurement Methodology, JEDEC Solid State Technology Association, 2005.
    • JESD22B112, "High Temperature Package Warpage Measurement Methodology", JEDEC Solid State Technology Association, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.