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Volumn , Issue , 2007, Pages 643-646

Silicon carbide coated mems strain sensor for harsh environment applications

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION RESISTANCE; ETCHING; INFRARED LAMPS; MEMS; POLYCRYSTALLINE MATERIALS; POTASSIUM HYDROXIDE; SILICON CARBIDE;

EID: 52249106640     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/memsys.2007.4433166     Document Type: Conference Paper
Times cited : (36)

References (11)
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    • (2005) JMEMS , vol.14 , Issue.5 , pp. 903-913
    • Sharpe, J.W.N.1    Jadaan, O.2    Beheim, G.M.3    Quinn, G.D.4    Nemeth, N.N.5
  • 2
    • 3042704176 scopus 로고    scopus 로고
    • Tribological impact of SiC encapsulation of released polycrystalline silicon microstructures
    • W. R. Ashurst, M. B. J. Wijesundara, C. Carraro, and R. Maboudian, "Tribological impact of SiC encapsulation of released polycrystalline silicon microstructures," Tribology Letters, vol. 17, no. 2, pp. 195-198, 2004.
    • (2004) Tribology Letters , vol.17 , Issue.2 , pp. 195-198
    • Ashurst, W.R.1    Wijesundara, M.B.J.2    Carraro, C.3    Maboudian, R.4
  • 3
    • 0141964094 scopus 로고    scopus 로고
    • Nitrogen doping of polycrystalline 3c-sic films grown using 1,3-disilabutane in a conventional lpcvd reactor
    • M. B. J. Wijesundara, D. Gao, C. Carraro, R. T. Howe, and R. Maboudian, "Nitrogen doping of polycrystalline 3c-sic films grown using 1,3-disilabutane in a conventional lpcvd reactor," J. Cryst. Growth, vol. 259, no. 1.
    • J. Cryst. Growth , vol.259 , Issue.1
    • Wijesundara, M.B.J.1    Gao, D.2    Carraro, C.3    Howe, R.T.4    Maboudian, R.5
  • 5
    • 33748757953 scopus 로고    scopus 로고
    • Control of strain gradient in doped polycrystalline silicon carbide films through tailored doping
    • J. Zhang, R. T. Howe, and R. Maboudian, "Control of strain gradient in doped polycrystalline silicon carbide films through tailored doping," J. Micromech. Microeng., vol. 16, pp. L1-L5, 2006.
    • (2006) J. Micromech. Microeng , vol.16
    • Zhang, J.1    Howe, R.T.2    Maboudian, R.3
  • 6
    • 3142711483 scopus 로고    scopus 로고
    • Percent progress toward a manufacturable polycrystalline SiC surface micromachining technology
    • D. Gao, M. B. J. Wijesundara, C. Carraro, R. T. Howe, and R. Maboudian, "Percent progress toward a manufacturable polycrystalline SiC surface micromachining technology," IEEE Sensors J., vol. 4, no. 4, p. 441448, 2004.
    • (2004) IEEE Sensors J , vol.4 , Issue.4 , pp. 441448
    • Gao, D.1    Wijesundara, M.B.J.2    Carraro, C.3    Howe, R.T.4    Maboudian, R.5
  • 7
    • 33645062152 scopus 로고    scopus 로고
    • Mechanical properties of a micron-sized SCS film in a high-temperature environment
    • S. Nakao, T. Ando, M. Shikida, and K. Sato, "Mechanical properties of a micron-sized SCS film in a high-temperature environment," J. Micromech. Microeng., vol. 16, pp. 715-720, 2006.
    • (2006) J. Micromech. Microeng , vol.16 , pp. 715-720
    • Nakao, S.1    Ando, T.2    Shikida, M.3    Sato, K.4
  • 8
    • 0016424516 scopus 로고
    • Thermal expansion of some diamondlike crystals
    • G. A. Slack and S. F. Bartram, "Thermal expansion of some diamondlike crystals," J. Applied Physics, vol. 46, no. 1, pp. 89-98, 1975.
    • (1975) J. Applied Physics , vol.46 , Issue.1 , pp. 89-98
    • Slack, G.A.1    Bartram, S.F.2
  • 9
    • 3042778496 scopus 로고    scopus 로고
    • A MEMS Resonant Strain Sensor Operated in Air
    • K. E. Wojciechowski, B. E. Boser, and A. P. Pisano, "A MEMS Resonant Strain Sensor Operated in Air," MEMS '04, pp. 841-845, 2004.
    • (2004) MEMS '04 , pp. 841-845
    • Wojciechowski, K.E.1    Boser, B.E.2    Pisano, A.P.3
  • 11
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    • J. R. Westra, C. M. J. Werhoeven, and A. H. M. van Roermund, Resonance-mode Selection and Crosstalk Elimination Using Resonator-sychronized Relaxation Oscillators, Proceedings of the 24th European Solid-state Circuits Conference, pp. 88-91, 1998.
    • J. R. Westra, C. M. J. Werhoeven, and A. H. M. van Roermund, "Resonance-mode Selection and Crosstalk Elimination Using Resonator-sychronized Relaxation Oscillators," Proceedings of the 24th European Solid-state Circuits Conference, pp. 88-91, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.