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Volumn , Issue , 2008, Pages 151-154

Identification of RF harmonic distortion on Si substrates and its reduction using a trap-rich layer

Author keywords

Harmonic distortion; High resistivity Si substrate; Non linear measurements; RF switches; SOI technology

Indexed keywords

900 MHZ; COPLANAR WAVEGUIDE STRUCTURES; HIGH-RESISTIVITY SI SUBSTRATE; INPUT POWERS; NON-LINEAR MEASUREMENTS; RF SWITCHES; RF SYSTEMS; SI SUBSTRATES; SILICON SUBSTRATES; SOI TECHNOLOGY;

EID: 52049096665     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.2008.44     Document Type: Conference Paper
Times cited : (51)

References (12)
  • 3
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    • Single-pole four-throw high-power switch
    • RF1450 Data sheet
    • "Single-pole four-throw high-power switch," RF1450 Data sheet, http://www.rfmd.com/pdfs/1450DS.pdf.
  • 7
    • 85172752740 scopus 로고    scopus 로고
    • th Microwave Measurement Symposium, November 2007.
    • th Microwave Measurement Symposium, November 2007.
  • 8
    • 0018980803 scopus 로고
    • Energy distribution of trapping states in polycrystalline silicon
    • S. Hirae, M. Hirose, Y. Osaka, "Energy distribution of trapping states in polycrystalline silicon," J. Appl. Phys., 51(2), pp. 1043-1047, 1980.
    • (1980) J. Appl. Phys , vol.51 , Issue.2 , pp. 1043-1047
    • Hirae, S.1    Hirose, M.2    Osaka, Y.3
  • 9
    • 16244389280 scopus 로고    scopus 로고
    • Enhanced high resistivity SOI wafers for RF applications
    • D. Lederer, R. Lobet and J.-P. Raskin, "Enhanced high resistivity SOI wafers for RF applications," IEEE Intl. SOI Conf., pp. 46-47, 2004.
    • (2004) IEEE Intl. SOI Conf , pp. 46-47
    • Lederer, D.1    Lobet, R.2    Raskin, J.-P.3
  • 10
    • 27744571537 scopus 로고    scopus 로고
    • New substrate passivation method dedicated to high resistivity SOI wafer fabrication with increase substrate resistivity
    • D. Lederer and J.-P. Raskin, "New substrate passivation method dedicated to high resistivity SOI wafer fabrication with increase substrate resistivity," IEEE Electron Device Letters, vol. 26, no. 11, pp. 805-807, 2005.
    • (2005) IEEE Electron Device Letters , vol.26 , Issue.11 , pp. 805-807
    • Lederer, D.1    Raskin, J.-P.2
  • 11
    • 43749106028 scopus 로고    scopus 로고
    • Performance of RF passive structures and SOI MOSFETs transferred on a passivated HR SOI substrate
    • D. Lederer, B. Aspar, C. Laghaé and J.-P. Raskin, "Performance of RF passive structures and SOI MOSFETs transferred on a passivated HR SOI substrate," IEEE International SOI Conference, pp. 29-30, 2006.
    • (2006) IEEE International SOI Conference , pp. 29-30
    • Lederer, D.1    Aspar, B.2    Laghaé, C.3    Raskin, J.-P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.