Effect of Refractive Solid Immersion Lens parameters on the enhancement of laser induced fault localization techniques

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2008, Pages

  Goh, S H ^a   Quah, A C T ^a   Sheppard, C J R ^a   Chua, C M ^b   Koh, L S ^b   Phang, J C H ^a,b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b SEMICAPS Corporation   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; FAILURE ANALYSIS; INTEGRATED CIRCUITS; LASERS; LENSES; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL WAVEGUIDES; QUALITY ASSURANCE; RELIABILITY; SAFETY FACTOR; TECHNICAL PRESENTATIONS;

FAULT LOCALIZATION; INDUCED VOLTAGES; INTERNATIONAL SYMPOSIUM; LASER INDUCED; SIGNAL ENHANCEMENT; SOLID IMMERSION LENS;

ELECTRIC NETWORK ANALYSIS;

EID: 51949107507     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2008.4588146     Document Type: Conference Paper

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