Wrinkled-up nanochannel networks: Long-range ordering, scalability, and X-ray investigation

ACS Nano

Volumn 2, Issue 8, 2008, Pages 1715-1721

  Malachias, Angelo ^a   Mei, Yongfeng ^b   Annabattula, Ratnka K ^c   Deneke, Christoph ^b   Onck, Patrick R ^c   Schmidt, Oliver G ^a,b  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b IFW DRESDEN   (Germany)

^c UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Layer releasing; Long range ordering; Nanochannels; Nanomembranes; Photolithography; Strain; Wrinkles

Indexed keywords

CRYSTAL SYMMETRY; FINITE ELEMENT METHOD; TWO DIMENSIONAL;

CRYSTALLINE QUALITY; FEATURE SIZES; FILM PARAMETERS; FINITE ELEMENT MODELING; III-V SEMICONDUCTORS; LATTICE SYMMETRY; LAYER RELEASING; LONG-RANGE ORDERING; NANOCHANNELS; NANOMEMBRANES; PERIODIC ARRAYS; PHOTOLITHOGRAPHY; RIGID SUBSTRATES; SELF-ORGANIZED; STRAIN; STRAINED LAYERS; WET-CHEMICAL ETCHING; WRINKLES; X-RAY GRAZING INCIDENCE DIFFRACTION; X-RAY INVESTIGATIONS;

NANOFLUIDICS;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE; X RAY DIFFRACTION;

COMPUTER SIMULATION; CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTORS; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 51849158351     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn800308p     Document Type: Article

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