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Journal of Applied Physics

Volumn 104, Issue 5, 2008, Pages

Theory of ultrafast electron diffraction: The role of the electron bunch properties

(3) Michalik, A M a Sherman, E Ya a,b Sipe, J E a

a UNIVERSITY OF TORONTO (Canada)

b UNIVERSITY OF THE BASQUE COUNTRY UPV EHU (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; DISTRIBUTION FUNCTIONS; ELECTRON DIFFRACTION; ELECTRONS; HOLOGRAPHIC INTERFEROMETRY; NUMERICAL ANALYSIS; PARTICLE BEAM BUNCHING; ULTRASHORT PULSES;

BUNCH PARAMETERS; COHERENCE LENGTHS; ELECTRON BUNCHING; FAR FIELDS; LENGTH SCALING; NANO-SIZE PARTICLES; NUMERICAL CALCULATIONS; PATTERN FORMATIONS; SCATTERING CALCULATIONS; SINGLE-SCATTERING; TARGET PARAMETERS; ULTRAFAST ELECTRON DIFFRACTION; WIGNER DISTRIBUTION;

SCATTERING;

EID: 51849128701 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2973157 Document Type: Article

Times cited : (27)

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