Efficient algorithm for the computation of on-chip capacitance sensitivities with respect to a large set of parameters

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 906-911

  El Moselhy, Tarek ^a   Elfadel, I M ^b   Widiger, David ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b IBM   (United States)

Author keywords

Adjoint method; Capacitance extraction; Sensitivity analysis

Indexed keywords

ADJOINT METHOD; CAPACITANCE EXTRACTION; DESIGN AUTOMATION CONFERENCE; SENSITIVITY ANALYSIS;

CAPACITANCE; COMPUTER AIDED DESIGN; DIGITAL INTEGRATED CIRCUITS; FINITE DIFFERENCE METHOD; INDUSTRIAL ENGINEERING; MACHINE DESIGN;

PROCESS ENGINEERING;

EID: 51549110620     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555949     Document Type: Conference Paper

References (10)

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