Combined optical and electrical analysis of AlGaN-based deep-UV LEDs reliability

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 441-445

  Meneghini, Matteo ^a   Trivellin, Nicola ^a   Trevisanello, Lorenzo ^a   Lunev, Alex ^b   Yang, Jinwei ^b   Bilenko, Yuriy ^b   Sun, Wenhong ^b   Shatalov, Maxim ^b   Gaska, Remis ^b   Zanoni, Enrico ^a   Meneghesso, Gaudenzio ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b SENSOR ELECTRONIC TECHNOLOGY INC   (United States)

Author keywords

Deep ultraviolet; Degradation; Light emitting diode; Reliability

Indexed keywords

DEEP-ULTRAVIOLET; LIGHT EMITTING DIODE; NON-RADIATIVE; OPTICAL POWERS; RELIABILITY;

DEGRADATION; ELECTRIC NETWORK ANALYSIS; LIGHT EMITTING DIODES; OHMIC CONTACTS; QUALITY ASSURANCE; RELIABILITY ANALYSIS; ULTRAVIOLET INSTRUMENTS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 51549094207     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558925     Document Type: Conference Paper

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