An approach to examining model dependence in EM reconstructions using cross-validation

Journal of Structural Biology

Volumn 142, Issue 2, 2003, Pages 301-310

  Shaikh, Tanvir R ^a   Hegerl, Reiner ^b   Frank, Joachim ^c,d  

^a WADSWORTH CENTER   (United States)

^b MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^c HOWARD HUGHES MEDICAL INSTITUTE   (United States)

^d STATE UNIVERSITY OF NEW YORK   (United States)

Author keywords

Cross validation; Electron microscopy; Free FSC; Model bias

Indexed keywords

ARTICLE; CONTROLLED STUDY; ELECTRON MICROSCOPY; NOISE; NONHUMAN; PARTICULATE MATTER; PRIORITY JOURNAL; RANDOMIZATION; VALIDATION PROCESS;

EID: 0037404096     PISSN: 10478477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1047-8477(03)00029-7     Document Type: Article

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