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Volumn , Issue , 2006, Pages 3090-3094

Chopper stabilized CMOS integrated front-end for magnetic field measurement

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTRIC MEASURING INSTRUMENTS; ELECTRONICS INDUSTRY; FUSION REACTIONS; INDUSTRIAL ELECTRONICS; MAGNETIC FIELDS; MAGNETIC PROSPECTING; NUCLEAR PHYSICS;

EID: 50249136489     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2006.347338     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 1
    • 3042825282 scopus 로고    scopus 로고
    • CMOS Microsystem for AC Current Measurement with Galvanic Isolation
    • December
    • V. Frick, L. Hébrard, P. Poure, F. Anstotz, F. Braun, "CMOS Microsystem for AC Current Measurement with Galvanic Isolation", IEEE Sensors Journal, vol. 3, no. 6, December 2003. pp. 752-760.
    • (2003) IEEE Sensors Journal , vol.3 , Issue.6 , pp. 752-760
    • Frick, V.1    Hébrard, L.2    Poure, P.3    Anstotz, F.4    Braun, F.5
  • 2
    • 50249096591 scopus 로고
    • Design techniques for low-noise CMOS operational amplifiers
    • Sept
    • H. W. Klein and W. L. Engl, "Design techniques for low-noise CMOS operational amplifiers," in ESSCIRC'84 Dig. Tech. Papers, Sept. 1984, pp. 27-30.
    • (1984) ESSCIRC'84 Dig. Tech. Papers , pp. 27-30
    • Klein, H.W.1    Engl, W.L.2
  • 4
    • 0034478802 scopus 로고    scopus 로고
    • A CMOS Nested-Chopper Instrumentation Amplifier with 100-nV Offset
    • December
    • A. Bakker, K. Thiele, and J. H. Huijsing, "A CMOS Nested-Chopper Instrumentation Amplifier with 100-nV Offset", IEEE Journal of Solid-State Circuits, vol. 35, no. 12, December 2000, pp. 1877-1883.
    • (2000) IEEE Journal of Solid-State Circuits , vol.35 , Issue.12 , pp. 1877-1883
    • Bakker, A.1    Thiele, K.2    Huijsing, J.H.3
  • 5
    • 0022768090 scopus 로고
    • Integrated Semiconductor Magnetic Field Sensors
    • August
    • Baltes H.P., Popovic R.S., "Integrated Semiconductor Magnetic Field Sensors." Proceedings of the IEEE, Vol. 74, no. 8, August 1986, pp. 1107-1132.
    • (1986) Proceedings of the IEEE , vol.74 , Issue.8 , pp. 1107-1132
    • Baltes, H.P.1    Popovic, R.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.