CMOS microsystem for AC current measurement with galvanic isolation

IEEE Sensors Journal

Volumn 3, Issue 6, 2003, Pages 752-760

  Frick, Vincent ^a   Hébrard, Luc ^a   Poure, Philippe ^a   Anstotz, Freddy ^a   Braun, Francis ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

Current sensor; Galvanic isolation; Hall effect devices; Microsystem; Submicron CMOS technology

Indexed keywords

ELECTRIC CONDUCTORS; ELECTRIC CURRENT MEASUREMENT; ELECTROMAGNETIC COMPATIBILITY; HALL EFFECT DEVICES; MAGNETIC FIELD EFFECTS; OPTIMIZATION; SWITCHING;

CURRENT SENSORS; GALVANIC ISOLATION; MICROSYSTEMS; SUBMICRON CMOS TECHNOLOGY;

CMOS INTEGRATED CIRCUITS;

EID: 3042825282     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2003.820555     Document Type: Article

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