In-plane dielectric characterization of epitaxial Ba(Zr 0.35Ti0.65)O3 thin films grown on LSAT (001)

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2007, Pages 222-225

  Yun, P ^a   Wang, D Y ^a   Wang, Y ^a   Chan, H L W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM;

DIELECTRIC CHARACTERIZATION; IN-PLANE; INTERNATIONAL SYMPOSIUM;

ZIRCONIUM;

EID: 51349166792     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2007.4393221     Document Type: Conference Paper

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