Direct electrical measurement of an individual α -Fe2 O3 nanobridge field effect transistor formed via one-step thermal oxidation

Applied Physics Letters

Volumn 93, Issue 8, 2008, Pages

  Hsu, Li Chieh ^a   Li, Yuan Yao ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL OXYGEN DEMAND; ELECTRIC PROPERTIES; MESFET DEVICES; OXIDATION;

NANO BRIDGES; THERMAL OXIDATION;

FIELD EFFECT TRANSISTORS;

EID: 51349159576     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976547     Document Type: Article

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