Terahertz emission from black silicon

Applied Physics Letters

Volumn 93, Issue 9, 2008, Pages

  Hoyer, P ^a   Theuer, M ^b   Beigang, R ^b   Kley, E B ^c  

^a FRAUNHOFER GESELLSCHAFT   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; SILICON;

EMITTED RADIATION; OPTICAL-; PUMP POWERS; TERAHERTZ; TERAHERTZ RANGE;

SURFACE STRUCTURE;

EID: 51349133601     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2978096     Document Type: Article

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