Terahertz time-domain spectroscopy characterization of the far-infrared absorption and index of refraction of high-resistivity, float-zone silicon

Journal of the Optical Society of America B: Optical Physics

Volumn 21, Issue 7, 2004, Pages 1379-1386

  Dai, Jianming ^a   Zhang, Jiangquan ^a   Zhang, Weili ^a   Grischkowsky, D ^a  

^a Oklahoma State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FREQUENCY DOMAIN ANALYSIS; LIGHT ABSORPTION; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SILICON; SINGLE CRYSTALS; SINGLE MODE FIBERS; TIME DOMAIN ANALYSIS; TRANSFER FUNCTIONS;

FAR INFRARED ABSORPTION; FLOAT ZONE SILICON; TERAHERTZ TIME DOMAIN SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 10044277024     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.21.001379     Document Type: Article

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