Reliability design of multilayer ceramic capacitor against thinning of dielectric layers

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2007, Pages 549-552

  Morita, Koichiro ^a   Mizuno, Youichi ^a   Kishi, Hiroshi ^a  

^a TAIYO YUDEN CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC ELECTRICITY; CAPACITANCE; CAPACITORS; CERAMIC MATERIALS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; ELECTRIC EQUIPMENT; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; MULTILAYERS; OXYGEN; RELIABILITY; STATISTICAL TESTS; TECHNICAL PRESENTATIONS; VACANCIES;

DIELECTRIC LAYERS; INTERNATIONAL SYMPOSIUM;

CERAMIC CAPACITORS;

EID: 51349096598     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2007.4393326     Document Type: Conference Paper

References (13)

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