Incomplete martensitic transformations in NiTi thin films

Scripta Materialia

Volumn 59, Issue 10, 2008, Pages 1067-1070

  Huang, Xu ^a   Lee, Hoo Jeong ^b   Ramirez, A G ^a,c  

^a Yale University   (United States)

^b Sungkyunkwan University   (South Korea)

^c Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Curvature measurement; Differential scanning calorimetry (DSC); Incomplete martensitic transformation; Shape memory alloys (SMA); Thin films

Indexed keywords

DIFFERENTIAL SCANNING CALORIMETRY; LASER INTERFEROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON WAFERS; THICK FILMS; THIN FILMS; TITANIUM;

CURVATURE MEASUREMENT; DIFFERENTIAL SCANNING CALORIMETRY (DSC); INCOMPLETE MARTENSITIC TRANSFORMATION; NICKEL-TITANIUM; SHAPE MEMORY ALLOYS (SMA);

MARTENSITIC TRANSFORMATIONS;

EID: 51349089555     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.07.017     Document Type: Article

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