SCOPUS 정보 검색 플랫폼

Volumn 93, Issue 9, 2008, Pages

Atomic scale analysis of the effect of the SiO2 passivation treatment on InAs/GaSb superlattice mesa sidewall

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; MICROSCOPIC EXAMINATION; OPTOELECTRONIC DEVICES;

MESA SIDEWALLS; PASSIVATION LAYERS; SURFACE LEAKAGE CURRENTS;

PASSIVATION;

EID: 51349088134 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2977589 Document Type: Article

Times cited : (28)

References (10)

1
- 36549095407
- 0021-8979 10.1063/1.339468.
- D. L. Smith and C. Mailhiot, J. Appl. Phys. 0021-8979 10.1063/1.339468 62, 2545 (1987).
- (1987) J. Appl. Phys. , vol.62 , pp. 2545
- Smith, D.L.¹ Mailhiot, C.²

2
- 84957278268
- 0734-2101 10.1116/1.576201.
- C. Mailhiot and D. L. Smith, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.576201 7, 445 (1989).
- (1989) J. Vac. Sci. Technol. A , vol.7 , pp. 445
- Mailhiot, C.¹ Smith, D.L.²

3
- 26444497943
- 0277-786X 10.1117/12.606621.
- G. J. Brown, Proc. SPIE 0277-786X 10.1117/12.606621 5783, 65 (2005).
- (2005) Proc. SPIE , vol.5783 , pp. 65
- Brown, G.J.¹

4
- 34250731265
- 0003-6951 10.1063/1.2747172.
- A. Hood, P. -Y. Delaunay, D. Hoffman, B. -M. Nguyen, Y. Wei, M. Razeghi, and V. Nathan, Appl. Phys. Lett. 0003-6951 10.1063/1.2747172 90, 233513 (2007).
- (2007) Appl. Phys. Lett. , vol.90 , pp. 233513
- Hood, A.¹ Delaunay, P.-Y.² Hoffman, D.³ Nguyen, B.-M.⁴ Wei, Y.⁵ Razeghi, M.⁶ Nathan, V.⁷

5
- 1942509394
- 0003-6951 10.1063/1.1686894.
- A. Gin, Y. Wei, A. Hood, A. Bajowala, V. Yazdanpanah, M. Razeghi, and M. Z. Tidrow, Appl. Phys. Lett. 0003-6951 10.1063/1.1686894 84, 2037 (2004).
- (2004) Appl. Phys. Lett. , vol.84 , pp. 2037
- Gin, A.¹ Wei, Y.² Hood, A.³ Bajowala, A.⁴ Yazdanpanah, V.⁵ Razeghi, M.⁶ Tidrow, M.Z.⁷

6
- 17044412672
- 0003-6951 10.1063/1.1879113.
- Y. Wei, A. Hood, H. Yau, V. Yazdanpanah, M. Razeghi, M. Z. Tidrow, and V. Nathan, Appl. Phys. Lett. 0003-6951 10.1063/1.1879113 86, 091109 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 091109
- Wei, Y.¹ Hood, A.² Yau, H.³ Yazdanpanah, V.⁴ Razeghi, M.⁵ Tidrow, M.Z.⁶ Nathan, V.⁷

7
- 1342302427
- 0040-6090 10.1016/j.tsf.2003.09.002.
- A. Gin, Y. Wei, J. Bae, A. Hood, J. Nah, and M. Razeghi, Thin Solid Films 0040-6090 10.1016/j.tsf.2003.09.002 447-448, 489 (2004).
- (2004) Thin Solid Films , vol.447-448 , pp. 489
- Gin, A.¹ Wei, Y.² Bae, J.³ Hood, A.⁴ Nah, J.⁵ Razeghi, M.⁶

8
- 28344447467
- 0003-6951 10.1063/1.2089170.
- A. Hood, M. Razeghi, E. H. Aifer, and G. J. Brown, Appl. Phys. Lett. 0003-6951 10.1063/1.2089170 87, 151113 (2005).
- (2005) Appl. Phys. Lett. , vol.87 , pp. 151113
- Hood, A.¹ Razeghi, M.² Aifer, E.H.³ Brown, G.J.⁴

9
- 0031422724
- 0968-4328 10.1016/S0968-4328(97)00033-4.
- N. D. Browning, D. J. Wallis, P. D. Nellist, and S. J. Pennycook, Micron 0968-4328 10.1016/S0968-4328(97)00033-4 28, 333 (1997).
- (1997) Micron , vol.28 , pp. 333
- Browning, N.D.¹ Wallis, D.J.² Nellist, P.D.³ Pennycook, S.J.⁴

10
- 33746084494
- L. F. Fu, N. D. Browning, D. C. Kundaliya, S. X. Zhang, W. Ramadan, T. Venkatesan, and S. B. Ogale, Ceram. Trans. 191, 171 (2006).
- (2006) Ceram. Trans. , vol.191 , pp. 171
- Fu, L.F.¹ Browning, N.D.² Kundaliya, D.C.³ Zhang, S.X.⁴ Ramadan, W.⁵ Venkatesan, T.⁶ Ogale, S.B.⁷

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