Nanoscale aggregation phenomena at the contact line of air-drying pure water droplets on silicon revealed by atomic force microscopy

Current Applied Physics

Volumn 9, Issue 1, 2009, Pages 48-58

  Mendez Vilas A ^a   Jodar Reyes A B ^a   Diaz J ^a   Gonzalez Martin M L ^a  

^a UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

AFM; Atomic force microscopy; Contact angle; Heterogeneity; Organic airborne contamination; Silicon; Wetting

Indexed keywords

ACIDS; AGGLOMERATION; ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CARBON; CARBON NANOTUBES; COMPUTER NETWORKS; CONTACT ANGLE; DEWATERING; DROP FORMATION; DROPS; FLUID MECHANICS; FRACTALS; HYDROPHOBICITY; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; SILICON; SOLUTIONS; SURFACE CLEANING; WETTING;

AFM; HETEROGENEITY; NETWORK STRUCTURES; ORGANIC AIRBORNE CONTAMINATION; WAFER SURFACES;

SILICON WAFERS;

EID: 51249102381     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2007.11.009     Document Type: Article

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