Scanning transmission x-ray microscopy: A new method for the investigation of aggregation in silica

Journal of Colloid and Interface Science

Volumn 185, Issue 1, 1997, Pages 217-227

  Beelen, Theo P M ^a   Shi, Weidong ^b   Morrison, Graeme R ^b   Van Garderen, Harold F ^a   Browne, Mike T ^b   Van Santen, Rutger A ^a   Pantos, Emmanuel ^c  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c DARESBURY LABORATORY   (United Kingdom)

Author keywords

Aggregates; Colloids; Fractal; Silica; STXM; X ray microscopy

Indexed keywords

SILICON DIOXIDE;

ARTICLE; COLLOID; MICROSCOPY; PRIORITY JOURNAL; TECHNIQUE; X RAY ANALYSIS;

EID: 0030844092     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.1996.4593     Document Type: Article

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