Energy calibration of a high-resolution inelastic x-ray scattering spectrometer

Review of Scientific Instruments

Volumn 79, Issue 8, 2008, Pages

  Verbeni, Roberto ^a   D'Astuto, Matteo ^a   Krisch, Michael ^a   Lorenzen, Maren ^a   Mermet, Alain ^a   Monaco, Giulio ^a   Requardt, Herwig ^a   Sette, Francesco ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; DIAMONDS; DISPERSION (WAVES); LIQUEFIED GASES; LIQUID NITROGEN; OPTICAL RECORDING; PHONONS; PHYSICAL OPTICS; POWDERS; SCATTERING; SILICON; SILICON WAFERS; SINGLE CRYSTALS; SPECTROMETERS; SPECTROMETRY; THERMAL SPRAYING; VIBRATIONS (MECHANICAL); X RAY SCATTERING; X RAY SPECTROMETERS;

ENERGY SCALING; HIGH RESOLUTIONS; INELASTIC X-RAY SCATTERING; MEV ENERGY; X-RAY SPECTROMETER;

THERMAL EXPANSION;

DIAMOND; NITROGEN; SILICON;

ARTICLE; CALIBRATION; CHEMISTRY; CRYSTALLIZATION; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; OPTICS; PHYSICAL PHENOMENA; RADIATION SCATTERING; SPECTROPHOTOMETRY; TEMPERATURE; VIBRATION; X RAY;

CALIBRATION; CRYSTALLIZATION; DIAMOND; EQUIPMENT DESIGN; INTERFEROMETRY; NITROGEN; OPTICS AND PHOTONICS; PHYSICAL PROCESSES; SCATTERING, RADIATION; SILICON; SPECTROPHOTOMETRY; TEMPERATURE; VIBRATION; X-RAYS;

EID: 50849139864     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2968118     Document Type: Article

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