Plasma-enhanced synthesis of thin fluoropolymer layers with low Raman and fluorescence backgrounds

Langmuir

Volumn 24, Issue 16, 2008, Pages 8672-8677

  Hongquan, Jiang ^a,b   Jantan, M K ^a   Manolache, S ^b   Denes, F S ^a,b   Lagally, M G ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORO POLYMERS; LOW COEFFICIENT OF FRICTION; RADIO FREQUENCY PLASMAS; THERMAL STABILITY;

ARCHITECTURAL ACOUSTICS; CHEMICAL STABILITY; CONCENTRATION (PROCESS); PHOTORESISTS; PLASMA DEPOSITION; PLASMAS; POLYMERS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTRUM ANALYSIS; STAINLESS STEEL; SURFACE CHEMISTRY; SURFACE TENSION; THICK FILMS; THICKNESS MEASUREMENT;

PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

FLUORINE DERIVATIVE;

ARTICLE; CHEMISTRY; MASS SPECTROMETRY; RAMAN SPECTROMETRY; SPECTROFLUOROMETRY; SYNTHESIS;

FLUORINE COMPOUNDS; MASS SPECTROMETRY; SPECTROMETRY, FLUORESCENCE; SPECTRUM ANALYSIS, RAMAN;

EID: 50849122962     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la801396k     Document Type: Article

References (25)

1. Campion, A.; Kambhampati, P. Chem. Soc. Rev. 1998, 27(4), 241-250.
2. Schut, T. C. B.; Puppels, G. J.; Kraan, Y. M.; Greve, J.; VanderMaas, L. L. J.; Figdor, C. G. Int. J. Cancer 1997, 74(1), 20-25.
3. Kajiwara, K.; Franks, F.; Echlin, P.; Greer, A. L. Pharm. Res. 1999, 16(9), 1441-1448.
4. Carden, A.; Rajachar, R. M.; Morris, M. D.; Kohn, D. H. Calcif. Tissue Int. 2003, 72(2), 166-175.
5. Zhang, D. M.; Xie, Y.; Mrozek, M. F.; Ortiz, C.; Davisson, V. J.; BenAmotz, D. Anal. Chem. 2003, 75(21), 5703-5709.
6. Fleischmann, M.; Hendra, P. J.; McQuillan, A. J. Chem. Phys. Lett. 1974, 26(2), 163-166.
7. Laurent, G.; Felidj, N.; Aubard, J.; Levi, G.; Krenn, J. R.; Hohenau, A.; Schider, G.; Leitner, A.; Aussenegg, F. R. Phys. Rev. B 2005, 71, (4).
8. Arutyunyan, N. R.; Brandt, N. N.; Chikishev, A. Y.; Lebedenko, S. I.; Parashchuk, O. D.; Razzhivin, A. P. Fluctuation and Noise Len. 2005, 5(2), L233-L241.
9. Ramos, P. M.; Ruisanchez, I. J. Raman Spectrosc. 2005, 36(9), 848-856.
10. Dung, D. M.; Mrozek, M. F.; Xie, Y.; Ben-Amotz, D. Appl. Spectrosc. 2004, 58(8), 929-933.
11. Xie, Y.; Zhang, D. M.; Jarori, G. K.; Davisson, V. J.; Ben-Amotz, D. Anal. Biochem. 2004, 332(1), 116-121.
12. Zhang, D. M.; Ortiz, C.; Xie, Y.; Davisson, V. J.; Ben-Amotz, D. Spectrochim. Acta, Part A 2005, 61(3), 471-475.
13. Deegan, R. D.; Bakajin, O.; Dupont, T. F.; Huber, G.; Nagel, S. R.; Witten, T. A. Nature 1997, 389(6653), 827-829.
14. Denes, F.; Hua, Z. Q.; Simonsick, W. J.; Aaserud, D. J. J. Appl. Polym. Sci. 1999, 71(10), 1627-1639.
15. Cruz-Barba, L. E.; Manolache, S.; Denes, F. Langmuir 2002, 18(24), 9393-9400.
16. Shamamian, V. A.; Hinshelwood, D. D.; Guerin, D. C.; Denes, F. S.; Manolache, S. J. Photopolym. Sci. Technol 2001, 14(1), 91-100.
17. Wu, Y. J. G.; , A. J.; Jen, J.; Manolache, S.; Denes, F.; Timmons, R. B. Plasmas Polym. 2001, 6(3), 123-144.
18. Cruz-Barba, L. E.; Manolache, S.; Denes, F. Polym. Bull. 2003, 50(5-6), 381-387.
19. Beamson, G.; Briggs, D., High Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; John Wiley and Sons: Chichester, 1992; p 295.
20. Antonel, P. S.; Andrade, E. M.; Molina, F. V. Electrochim. Acta 2004, 49(22-23), 3687-3692.
21. Ellison, C. J.; Kim, S. D.; Hall, D. B.; Torkelson, J. M. Eur. Phys. J. E 2002, 8(2), 155-166.
22. Yang, J. S.; Swager, T. M. J. Am. Chem. Soc. 1998, 120(46). 11864-11873.
23. Fernandez, J. E.; Rubio, M. Nuci. Instrum. Methods Phys. Res., Sect. A 1989, 280(2-3), 539-545.
24. Shu, Q. Q.; Hansma, P. K. Thin Solid Films 2001, 384(1), 76-84.
25. Birks, J. B. Mol. Cryst. Liq. Cryst. 1974, 28(1-2), 117-29.