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Volumn 43, Issue 17, 2008, Pages 5952-5955
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Loading rate sensitivity of nanoindentation creep in polycrystalline Ni films
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Author keywords
[No Author keywords available]
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Indexed keywords
CREEP;
MOLECULAR BEAM EPITAXY;
NANOINDENTATION;
NICKEL;
NICKEL ALLOYS;
PHOTORESISTS;
THICK FILMS;
CREEP TESTS;
HOLDING TIME;
INDENTATION CREEP;
INDENTATION LOADING;
LOADING RATES;
LOADING TIME;
LOADING TIMES;
NI FILMS;
POLY-CRYSTALLINE;
STRESS EXPONENTS;
THIN FILMS;
LOADING;
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EID: 50849087336
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-008-2838-0 Document Type: Article |
Times cited : (62)
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References (16)
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