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Volumn 45, Issue 8, 2001, Pages 971-976
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Creep and strain burst in indium and aluminium during nanoindentation
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Author keywords
Aluminium; Creep; Hardness testing; Indium; Yield phenomena
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Indexed keywords
ALUMINUM;
ATOMIC FORCE MICROSCOPY;
CREEP;
INDENTATION;
INDIUM;
SPECIMEN PREPARATION;
STRAIN;
STRAIN BURST;
HARDNESS TESTING;
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EID: 0035968947
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(01)01120-4 Document Type: Article |
Times cited : (83)
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References (13)
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