Indentation scale dependence of tip-in creep behavior in Ni thin films

Scripta Materialia

Volumn 59, Issue 2, 2008, Pages 195-198

  Ma, Z S ^a   Long, S G ^a   Zhou, Y C ^a   Pan, Y ^a  

^a XIANGTAN UNIVERSITY   (China)

Author keywords

Creep; Nanoindentation; Nickel film; Stress exponent

Indexed keywords

CREEP TESTING; GRAIN BOUNDARIES; NANOINDENTATION; NICKEL; STRESS ANALYSIS;

GRAIN ROTATION; INDENTATION STRESS; STRESS EXPONENTS;

THIN FILMS;

EID: 43649091783     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.03.014     Document Type: Article

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