Analysis of water condensation in P123 templated 2D hexagonal mesoporous silica films by X-ray reflectivity

Thin Solid Films

Volumn 516, Issue 22, 2008, Pages 7955-7961

  Yan, Minhao ^a   Dourdain, Sandrine ^a   Gibaud, Alain ^a  

^a UNIVERSITÉ DU MAINE   (France)

Author keywords

Capillary condensation; Kelvin equation; Mesoporous materials; Porosity; Silica thin films; X ray Reflectivity

Indexed keywords

REFLECTION; SILICA; SILICATE MINERALS; SILICON COMPOUNDS; THICK FILMS; WATER ANALYSIS; X RAY DIFFRACTION;

CAPILLARY CONDENSATION; HEXAGONAL MESOPOROUS SILICA; KELVIN EQUATION; MESOPOROUS SILICA THIN FILMS; POROSITY; SILICA THIN FILMS; TEMPLATED; WATER CONDENSATION; X-RAY REFLECTIVITY;

MESOPOROUS MATERIALS;

EID: 50649102819     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.04.003     Document Type: Article

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