Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN

Institute of Physics Conference Series

Volumn 179, Issue , 2004, Pages 115-118

  Moldovan, Grigore ^a   Harrison, Ian ^a   Roe, Martin ^a   Brown, Paul D ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEPOSITION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; GALLIUM NITRIDE; GLASS; GRAIN BOUNDARIES; METALLIZING; MOLECULAR BEAM EPITAXY; OHMIC CONTACTS; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON BEAM INDUCED CONDUCTIVITY (EBIC); GLASS SHADOW MASKS; METAL DEPOSITION; SCHOTTKY CONTACTS;

GOLD;

EID: 5044235626     PISSN: 09513248     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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