Studies on the thermoelectric effect in semiconducting ZnTe thin films

Journal of Materials Science: Materials in Electronics

Volumn 19, Issue 11, 2008, Pages 1114-1121

  Hossain, M S ^a   Islam, R ^a   Shahjahan, M ^a   Khan, K A ^a  

^a UNIVERSITY OF RAJSHAHI   (Bangladesh)

Author keywords

[No Author keywords available]

Indexed keywords

E-BEAM EVAPORATIONS; GLASS SUBSTRATES; IN-VACUUM; ZINC TELLURIDE; ZNTE THIN FILMS;

SEMICONDUCTING ZINC COMPOUNDS; THERMOELECTRIC POWER; THICK FILMS; THIN FILMS; VACUUM EVAPORATION; ZINC; ZINC COMPOUNDS;

SEMICONDUCTING FILMS;

EID: 50349102019     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9483-2     Document Type: Article

References (37)

1. A.Z. Nozik, R. Memming, J. Phys. Chem. 100, 13061 (1996)
2. J.O.M. Bockris, K. Uosaki, J. Electrochem. Soc. 124, 1348 (1997)
3. K.K. Mishra, K. Rajeshwar, J. Electrochem. Soc. 273, 169 (1978)
4. D. Ham, K.K. Mishra, K. Rajeshwar, J. Electrochem. Soc. 138, 100 (1991)
5. R. Könenkamp, P. Hoyer, A. Wahi, J. Appl. Phys. 79, 7029 (1996)
6. F. Zenia, C. Lévy-Clément, R. Triboulet, R. Könenkamp, Electrochem. Solid-State Lett. 3, 73 (2000)
7. K. Sato, T. Asahi, M. Hanafusa, A. Noda, A. Arakawa, M. Uchida, O. Oda, Y. Yamada, T. Taguchi, Phys. Status Solidi (a) 180, 267 (2000)
8. K. Sato, M. Hanafusa, A. Noda, A. Arakawa, M. Uchida, T. Asahi, O. Oda, J. Cryst. Growth 214/215, 1080 (2000)
9. T. Mahalingam, V.S. John, P.J. Sebastian, J. Phys.: Condens. Mater. 14, 5367 (2002)
10. D. Rioux, D.W. Niles, H. Höchst, J. Appl. Phys. 73, 8381 (1996)
11. K. Yoshino, A. Memon, M. Yoneta, K. Ohmori, H. Saito, M. Ohishi, Phys. Status Solidi (b) 229, 977 (2002)
12. K.N. Raju, R.P. Vijayalakshmi, R. Vanugopal, D.R. Reddy, B.K. Reddy, Mater. Lett. 13, 336 (1992)
13. A.K.S. Aquili, Z. Ali, A. Maqsood, Appl. Surf. Sci. 167, 1 (2000)
14. T. Ishzaki, T. Ohtomo, A. Fuwa, J. Phys. D: Appl. Phys. 37, 255 (2004)
15. A. Mondal, S. Chaudhuri, A.K Pal, Appl. Phys. A: Mater. Sci. Proces. 43, 81 (1987)
16. H. Bellakhder, A. Outzourhit, E.L. Ameziane, Thin Solid Films 382, 30 (2001)
17. R.L. Gunshor, L.A. Koladziejski, N. Otsuka, S. Datta, Surf. Sci. 174, 522 (1986)
18. M. Neumann-Spallart, C. Königstein, Thin Solid Films 265, 33 (1995)
19. B. Bozzini, M.A. Baker, P.L. Cavallotti, E. Cerri, C. Lenardi, Thin Solid Films 361, 388 (2000)
20. M.S. Hossain, R. Islam, K.A. Khan, J. Renewable Energy (in Press). doi: 10.1016/j.renene.2007.04.003
21. S. Tolansky, in Multiple Beam Interferometry of Surfaces and Films (University Press, Oxford, 1948)
22. A. Goswami, in Thin Film Fundamentals (New Age Int. (P) Lt., Publishers, New Delhi, 1996) p. 314
23. K.L. Chopra, in Thin Films Phenomena (McGraw-Hill Publ. Co., New York, 1969)
24. V.D. Das, J.C. Mohanty, J. Appl. Phys. 54, 977 (1983)
25. N.W. Ashcroft, N.D. Mermin, in Solid State Physics, Chap-28 (Holt, Rinehart and Winston Publishers, New York, 1976) p. 573-574
26. A. Goswami, in Thin Film Fundamentals (New Age Int. (P) Lt., Publishers, New Delhi, 1996) p. 504
27. H. Fritzsche, in Amorphous and Liquid Semiconductors (Plenum Press, New York, 1971)
28. H. Harry, B. Kwok, R.H. Bube, J. Appl. Phys. 44, 138 (1973)
29. H. Fritzsche, Solid State Commun. 9, 1813 (1971)
30. D. Kranzer, J. Phys. C: Solid State Phys. 6, 2977 (1973)
31. H. Tubota, Jpn. J. Appl. Phys. 2, 259 (1963)
32. M. Aven, B. Segall, Phys. Rev. 130, 81 (1963)
33. K.N. Raju, R.P. Vijayalakshmi, R. Vanugopal, D.R. Reddy, B.K. Reddy, Mater. Lett. 13, 336 (1992)
34. N.F. Mott, E.A. Davis, in Electronic Processes in Non-crystalline Materials, 2nd edn. (Clarendon Press, Oxford, 1979) pp. 47, 48, 235, 271, 273
35. X. Huang, J. Li, J. Am. Chem. Soc. 122, 8789 (2000)
36. J. Li, L.-W. Wang, Phys. Rev. B 72, 125325 (2005)
37. A.K.M. Farid Ul Islam, R. Islam, K.A. Khan, J. Mater. Sci.: Mater. Electron. 16, 203 (2005)