Organic molecule characterization - G-SIMS

Applied Surface Science

Volumn 231-232, Issue , 2004, Pages 224-229

  Gilmore, I S ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Fragmentation; G SIMS; Identification; Interpretation; Molecular structure; Static SIMS

Indexed keywords

COMPUTATIONAL COMPLEXITY; DEGRADATION; ELECTRONIC EQUIPMENT; FUNCTIONS; MOLECULAR STRUCTURE; NEURAL NETWORKS; ORGANIC ACIDS; POSITIVE IONS; RELIABILITY; SECONDARY ION MASS SPECTROMETRY;

FRAGMENTATION; IDENTIFICATION; INTERPRETATION; STATIC SIMS;

SURFACE PROPERTIES;

EID: 2942562362     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.03.018     Document Type: Conference Paper

References (8)

1. Gilmore I.S., Seah M.P. Surf. Interf. Anal. 29:2000;624.
2. I.S. Gilmore. M.P. Seah, to be published.
3. J.C. Vickerman, D. Briggs, A. Henderson (Eds.), The Static SIMS Library, version 2, SurfaceSpectra, Manchester, UK, 2003.
4. B.C. Schwede, T. Heller, D. Rading, E. Niehius, L. Wiedmann, A. Benninghoven, The Münster High Mass Resolution Static SIMS Library, ION-TOF, Münster, 2003.
5. D. Briggs, A. Brown, J.C. Vickerman, Handbook of Static Secondary Ion Mass Spectrometry (SIMS), Wiley, Chichester, 1989.
6. Gilmore I.S., Seah M.P. Appl. Surf. Sci. 161:2000;465.
7. Gilmore I.S., Seah M.P. Appl. Surf. Sci. 203-204:2003;551.
8. I.S. Gilmore. M.P. Seah, to be published.