First evidence for injection statistics accuracy limitations in NAND Flash constant-current Fowler-Nordheim programming

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 165-168

  Compagnoni, C Monzio ^a,b   Spinelli, A S ^c   Gusmeroli, R ^a   Lacaita, A L ^c   Beltrami, S ^d   Ghetti, A ^d   Visconti, A ^d  

^a POLITECNICO DI MILANO   (Italy)

^b IUNET

^c IFN CNR   (Italy)

^d STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICES; FLASH MEMORY;

ACCURACY LIMITATIONS; CELL DIMENSIONS; CONSTANT CURRENTS; FLOATING GATES; FOWLER-NORDHEIM PROGRAMMING; NAND FLASH; NAND FLASH MEMORIES; NUMBER OF ELECTRONS; PROGRAMMING ALGORITHMS; TECHNOLOGY NODES;

STATISTICAL METHODS;

EID: 50249132614     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4418892     Document Type: Conference Paper

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