Analytical fitting model for rough-surface BRDF

Optics Express

Volumn 16, Issue 17, 2008, Pages 12892-12898

  Renhorn, Ingmar G E ^a   Boreman, Glenn D ^b  

^a SWEDISH DEFENCE RESEARCH AGENCY   (Sweden)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

ANGLES OF INCIDENCE; CORRELATION LENGTHS; FITTING PARAMETERS; FUNCTIONAL FORMS; NUMERICAL COMPUTATIONS; ORDERS OF MAGNITUDE; PHYSICS-BASED MODELING; RETRO REFLECTION;

SURFACE MEASUREMENT;

ARTICLE; COMPUTER SIMULATION; LIGHT; MATERIALS TESTING; METHODOLOGY; RADIATION SCATTERING; REFRACTOMETRY; SURFACE PROPERTY; THEORETICAL MODEL;

COMPUTER SIMULATION; LIGHT; MATERIALS TESTING; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PROPERTIES;

EID: 50049114981     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.012892     Document Type: Article

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